XM² PGR Ben Hogan (4th year) recently published his work on ‘Probing Raman Scattering for Particle Tracking: a novel spectrocscopic analysis method‘ as the cover story in Micrcoscopy and Analysis (Sep/Oct 2018): https://lnkd.in/dmsEkyd
The article presents a summary of the current achievements of the team’s ongoing investigations using Raman spectroscopy to characterise and track particles of different materials. Microscopy and Analysis is the leading international journal for microscopists, with over 46,000 subscribers and 120,000 readers worldwide. The journal is distributed free of charge.